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Vikram D Kinra

age ~75

from College Station, TX

Also known as:
  • Vikram Dr Kinra
  • Vikram Kinra
  • Vikram Inra
  • Vishal Kinra
  • Visha Kinra
9206 Lake Forest Ct, College Station, TX 77845979-764-8494

Vikram Kinra Phones & Addresses

  • 9206 Lake Forest Ct, College Sta, TX 77845 • 979-764-8494
  • 1106 Deacon Dr, College Station, TX 77845 • 979-695-8255 • 979-764-8494
  • 1714 Laura Ln, College Station, TX 77840 • 979-764-8494
  • 9206 Lake Forest Ct N, College Sta, TX 77845 • 972-768-4173

Work

  • Position:
    Executive, Administrative, and Managerial Occupations

Isbn (Books And Publications)

M3D: Mechanics and Mechanisms of Material Damping

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Author
Vikram K. Kinra

ISBN #
0803114958

M3d III: Mechanics and Mechanisms of Material Damping

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Author
Vikram K. Kinra

ISBN #
0803124171

Wave Propagation and Emerging Technologies: Presented at 1994 International Mechanical Engineering Congress and Exposition, Chicago, Illinois, November 6-11, 1994

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Author
Vikram K. Kinra

ISBN #
0791814343

On the Recent Advances of the Ultrasonic Evaluation and Composite Material Characterization: Presented at the 1999 Asme International Mechanical Engineering Congress and Exposition, November 14-19, 19

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Author
Vikram K. Kinra

ISBN #
0791816516

Us Patents

  • Ultrasonic Non-Destructive Evaluation Of Thin Specimens

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  • US Patent:
    53052390, Apr 19, 1994
  • Filed:
    Oct 4, 1989
  • Appl. No.:
    7/416889
  • Inventors:
    Vikram K. Kinra - College Station TX
  • Assignee:
    The Texas A&M University System - College Station TX
  • International Classification:
    G06F 1520
  • US Classification:
    364507
  • Abstract:
    In the field of non-destructive evaluation of materials, conventional ultrasonic measurement techniques are limited to materials having a thickness which is relatively large compared to the wavelength of the ultrasonic signal used. The present technique enables the accurate ultrasonic non-destructive measurement of materials which are relatively small compared to the wavelength of the ultrasonic signal used. Ultrasonic signals received from a thin material are processed in the frequency-domain either directly or by use of a Fast Fourier Transform. Specifically, the frequency response of the ultrasonic transducers used in the measurement is removed from the frequency response of the signal received when measuring the material. This yields a frequency response which is indicative of the material alone. Then, the measured frequency response of the material is evaluated to determine unknown parameters of the material.
  • Laser Scanning Graphic Input System

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  • US Patent:
    55257640, Jun 11, 1996
  • Filed:
    Jun 9, 1994
  • Appl. No.:
    8/257730
  • Inventors:
    John L. Junkins - College Station TX
    Jagmohan S. Gadhok - Windsor CA
    Andrew M. Browder - College Station TX
    Vikram K. Kinra - College Station TX
  • International Classification:
    G08C 2100
    G09G 302
  • US Classification:
    178 18
  • Abstract:
    A graphic input system for digitizing the location of an object moving on a planar surface and utilizing two or more primary laser light beams, the output beam of each scanning the planar surface through interposed controllably pivotally mounted beam deflecting scan mirrors. A stylus is moved over the planar surface in response to the position of the deflected position of the scanning beam. A signal generating beam detector positioned adjacent the planar surface delivers signals to a logical circuit to create the instantaneous value of a position voltage signal which is proportional to the tangent of the scan angle of each of the controllably deflected laser beams.

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