Scott A Wiener

US Patent:

6364837, Apr 2, 2002

Filed:

Apr 28, 2000

Appl. No.:

09/561125

Inventors:

Richard B. Mazess - Madison WI
Scott A. Wiener - Mount Horeb WI
Richard F. Morris - Stoughton WI

Assignee:

Lunar Corporation - Madison WI

International Classification:

A61B 800

US Classification:

600449

Abstract:

An ultrasonic instrument employs a digital architecture to provide improved stability to sound speed measurements of human bone in vivo. A digitization of the received ultrasonic signal allows numerical analyses to be applied in determining precise arrival time of the waveform. The microprocessor may initiate the ultrasonic signal transmission and detect its arrival and may control the strength of the transmitted signal and the amplification of the received signal to optimize the signal path.

US Patent:

6491635, Dec 10, 2002

Filed:

Apr 28, 2000

Appl. No.:

09/561123

Inventors:

Richard B. Mazess - Madison WI
Scott A. Wiener - Mount Horeb WI
Richard F. Morris - Stoughton WI

Assignee:

Lunar Corporation - Madison WI

International Classification:

A61B 800

US Classification:

600449

Abstract:

An ultrasonic instrument employs a digital architecture to provide improved stability to sound speed measurements of human bone in vivo. A digitization of the received ultrasonic signal allows numerical analyses to be applied in determining precise arrival time of the waveform. The microprocessor may initiate the ultrasonic signal transmission and detect its arrival and may control the strength of the transmitted signal and the amplification of the received signal to optimize the signal path.

US Patent:

6517487, Feb 11, 2003

Filed:

Jul 20, 1999

Appl. No.:

09/357631

Inventors:

Richard B. Mazess - Madison WI
Scott A. Wiener - Mount Horeb WI
Richard F. Morris - Stoughton WI

Assignee:

Lunar Corporation - Madison WI

International Classification:

A61B 800

US Classification:

600449

Abstract:

A scanning ultrasonic apparatus provides measurements of a bone at a number of spatially separated locations. These measurements may produce an image or may be used to automatically identify a measurement region of interest or to align a series of measurements with each other despite possible shifting in the bony member in between measurements.

US Patent:

7884323, Feb 8, 2011

Filed:

Aug 15, 2006

Appl. No.:

12/064020

Inventors:

Thomas F. Kelly - Madison WI, US
Joseph H. Bunton - Madison WI, US
Scott A. Wiener - Mount Horeb WI, US

Assignee:

Cameca Instruments, Inc. - Mahwah NJ

International Classification:

G01N 23/00

US Classification:

250307, 250306, 250309, 2503411, 2503412, 850 18, 850 32, 850 33, 850 40, 850 48

Abstract:

The present invention relates generally to atom probes, atom probe specimens, and associated methods. For example, certain aspects are directed toward methods for analyzing a portion of a specimen that includes selecting a region of interest and moving a portion of material in a border region proximate to the region of interest so that at least a portion of the region of interest protrudes relative to at least a portion of the border region. The method further includes analyzing a portion of the region of interest. Other aspects of the invention are directed toward a method for applying photonic energy in an atom probe process by passing photonic energy through a lens system separated from a photonic device and spaced apart from the photonic device. Yet other aspects of the invention are directed toward a method for reflecting photonic energy off an outer surface of an electrode onto a specimen.

US Patent:

8575544, Nov 5, 2013

Filed:

Mar 22, 2011

Appl. No.:

13/053790

Inventors:

Thomas F. Kelly - Madison WI, US
Daniel R. Lenz - Stoughton WI, US
Scott A. Wiener - Mount Horeb WI, US

Assignee:

Cameca Instruments, Inc. - Madison WI

International Classification:

H01J 49/40

US Classification:

250287, 250281, 250282, 250286, 250288

Abstract:

An atom probe includes a detector which registers the time of flight of ions evaporated from a specimen, as well as the positions on the detector at which the ions impact and the kinetic energies of the ions. The detected position allows the original locations of the ions on the specimen to be mapped, and the times of flight and kinetic energies can be spectrally analyzed (e. g. , binned into sets of like values) to determine the elemental identities of the ions. The use of kinetic energy data as well as time of flight data can allow more accurate identification of composition than where time of flight data are used alone, as in traditional atom probes.

US Patent:

20070018504, Jan 25, 2007

Filed:

Oct 14, 2004

Appl. No.:

10/575812

Inventors:

Scott Wiener - Mount Horeb WI, US
Daniel Lenz - Stoughton WI, US

International Classification:

H03K 3/00

US Classification:

307108000

Abstract:

An improved electrical pulse generator incorporating MOSFET components, a programmable high voltage power supply, and a shaping network for generating short duration signals having narrow pulse widths and short rise times.

US Patent:

20090114620, May 7, 2009

Filed:

Jul 21, 2005

Appl. No.:

11/917685

Inventors:

Robert M. Ulfig - Middleton WI, US
Joseph H. Bunton - Madison WI, US
Thomas F. Kelly - Madison WI, US
David J. Larson - Madison WI, US
Richard L. Martens - Madison WI, US
Keith J. Thompson - Fitchburg WI, US
Scott A. Wiener - Mount Horeb WI, US

Assignee:

Imago Scientific Instruments Corporation - Madison WI

International Classification:

B44C 1/22
B05D 5/12

US Classification:

216 66, 216 83, 216 67, 427 58, 427523

Abstract:

A method for treating an atom probe electrode (), which comprises the steps of providing an atom electrode () having a surface () and an aperture (); and removing material () from the surface () to reduce a potential of the atom probe electrode creating a non-uniformity in an electric field () when the atom probe electrode is used in a atom probe device during specimen analysis.

US Patent:

20090138995, May 28, 2009

Filed:

Jun 16, 2006

Appl. No.:

11/917672

Inventors:

Thomas F. Kelly - Madison WI, US
David J. Larson - Madison WI, US
Richard L. Martens - Madison WI, US
Keith J. Thompson - Fitchburg WI, US
Robert M. Ulfig - Middleton WI, US
Scott A. Wiener - Mount Horeb WI, US

International Classification:

G12B 21/00

US Classification:

850 60

Abstract:

The present invention relates to treatments for atom probe components. For example, certain aspects are directed toward processes for treating an atom probe component that includes removing material from a surface of the atom probe component (e.g., using an ion beam, a plasma, a chemical etching process, and/or photonic energy). Another aspect of the invention is directed toward a method for treating an atom probe specimen that includes using a computing device to automatically control a voltage used in an ion sputtering process. Still other aspects of the invention are directed toward methods for treating an atom probe component that includes introducing photonic energy proximate to a surface of the atom probe component, annealing at least a portion of a surface of the atom probe component, coating at least a portion of a surface of the atom probe component, and/or cooling at least a portion of the atom probe component.