Sandeep Guliani - Folsom CA Chaitanya Rajguru - Folsom CA Kedar Mangrulkar - Fair Oaks CA
Assignee:
Intel Corporation - Santa Clara CA
International Classification:
G11C 1606
US Classification:
36518521, 365210
Abstract:
In one embodiment, the invention is an apparatus. The apparatus includes a column load component and a current mirror coupled in parallel with the column load component. The column load component is capable of being coupled to a FLASH cell and a sense amplifier.
Ritesh Trivedi - Fair Oaks CA Robert Baltar - Folsom CA Mark Bauer - Placerville CA Sandeep Guliani - Folsom CA Balaji Srinivasan - Fair Oaks CA
Assignee:
Intel Corporation - Santa Clara CA
International Classification:
G11C 1606
US Classification:
3651852, 36518518, 36518909
Abstract:
An apparatus and method are disclosed for providing a sample and hold voltage reference for non-volatile memory. According to one embodiment, the sample and hold voltage reference produces a reference voltage for a drain bias circuit of a memory cell.
Sandeep K. Guliani - Folsom CA Rajesh Sundaram - Fair Oaks CA Mase J. Taub - Elk Grove CA
Assignee:
Intel Corporation - Santa Clara CA
International Classification:
G11C 702
US Classification:
365210, 36523003, 36523006
Abstract:
A method for a VPX banked architecture. The method of one embodiment first segments a memory array into at least two banks. Each bank including memory cells. The banks are provided with a supply voltage.
Sandeep K. Guliani - Folsom CA Rajesh Sundaram - Fair Oaks CA Mase J. Taub - Elk Grove CA
Assignee:
Intel Corporation - Santa Clara CA
International Classification:
G11C 800
US Classification:
36523003, 36518511, 36523006
Abstract:
A method and apparatus to segment a programmable non-volatile memory array into at least two banks. The banks include memory cells. Each bank in the at least two banks is provided with a local programming voltage. Each local programming voltage is independent of the other local programming voltages supplied to the other banks.
Sandeep K. Guliani - Folsom CA Rajesh Sundaram - Fair Oaks CA Mase J. Taub - Elk Grove CA
Assignee:
Intel Corporation - Santa Clara CA
International Classification:
G11C 800
US Classification:
36523003, 36518511, 36523006
Abstract:
A method for a VPX banked architecture. The method of one embodiment first segments a memory array into at least two banks. Each bank including memory cells. The banks are provided with a supply voltage.
Ritesh Trivedi - Fair Oaks CA Mark Bauer - Placerville CA Sandeep Guliani - Folsom CA Balaji Srinivasan - Fair Oaks CA Kerry Tedrow - Folsom CA
Assignee:
Intel Corporation - Santa Clara CA
International Classification:
G11C 1606
US Classification:
36518521, 36518522, 36518511
Abstract:
According to the invention, an apparatus and method are disclosed for sensing the contents of non-volatile memory. According to one embodiment, a set of local sensing circuits is used to read the logical values stored in memory cells contained within a partition of a non-volatile memory device.
Ritesh Trivedi - Fair Oaks CA Robert Baltar - Folsom CA Mark Bauer - Placerville CA Sandeep Guliani - Folsom CA Balaji Srinivasan - Fair Oaks CA
Assignee:
Intel Corporation - Santa Clara CA
International Classification:
G11C 700
US Classification:
36518518, 3651852, 36518521, 36518524
Abstract:
An apparatus and method are disclosed for providing drain bias for non-volatile memory. According to one embodiment, the drain bias is provided utilizing a drain bias circuit that is referenced by a static voltage reference.
Ritesh Trivedi - Fair Oaks CA Robert Baltar - Folsom CA Mark Bauer - Placerville CA Sandeep Guliani - Folsom CA Balaji Srinivasan - Fair Oaks CA
Assignee:
Intel Corporation - Santa Clara CA
International Classification:
G11C 1606
US Classification:
3651852, 36518521, 36518518
Abstract:
An apparatus is disclosed for providing a load for a non-volatile memory drain bias circuit. Under an embodiment, a load for a non-volatile memory drain bias circuit comprises a column load and a current mirror, a reference voltage for the current mirror being a sample and hold voltage reference. The column load and the current mirror are coupled to a cascode device.