Ralph G Isaacs

US Patent:

6711235, Mar 23, 2004

Filed:

May 31, 2002

Appl. No.:

10/161276

Inventors:

Andrew Joseph Galish - West Chester OH
Thomas William Birdwell - Middletown OH
Ralph Gerald Isaacs - Cincinnati OH
Francis Howard Little - Cincinnati OH

Assignee:

General Electric Cormpany - Schenectady NY

International Classification:

G21K 102

US Classification:

378147, 378148, 378 57

Abstract:

An X-ray inspection system is provided having an X-ray source and first and second collimators. The first and second collimators are arranged in relation to the source and the target such that the portion of the target actually illuminated by The X-ray beam is substantially equal to the size of a selected inspection zone.

US Patent:

6985238, Jan 10, 2006

Filed:

Sep 25, 2002

Appl. No.:

10/065192

Inventors:

Ralph Gerald Isaacs - Cincinnati OH, US
John Charles Janning - Cincinnati OH, US
Francis Howard Little - Cincinnati OH, US
James Robert Reinhardt - Okeana OH, US
Joseph Benjamin Ross - Cincinnati OH, US

Assignee:

General Electric Company - Niskayuna NY

International Classification:

G01B 11/24

US Classification:

356601, 356613, 702155, 702167

Abstract:

A non-contact measurement system employing a non-contact optical sensor and an edge detection sensor with a positioning system for moving the sensors over the surface and edges of a part (A) held in a predetermined, fixed position. The part is aligned in a co-ordinate system for obtaining accurate measurements of the part's surface (S) and edges (E). For parts smaller than the optical sensor's field of view, the part is rotated about an axis so both sides of the part are viewed by the sensor. If required, the part can also be shifted linearly along a horizontal axis (X) parallel to the sensor. For parts larger in size than the sensor's field of view, the part is moved along a vertical axis (Y) in predetermined segments so all of the part is exposed to viewing by the sensor.

US Patent:

7499830, Mar 3, 2009

Filed:

Nov 15, 2005

Appl. No.:

11/274579

Inventors:

Kevin George Harding - Niskayuna NY, US
Jianming Zheng - Shanghai, CN
Yongqing Li - Ann Arbor MI, US
Ming Jia - Shanghai, CN
Guiju Song - Shanghai, CN
Joseph Benjamin Ross - Cincinnati OH, US
Ralph Gerald Isaacs - Cincinnati OH, US

Assignee:

General Electric Company - Niskayuna NY

International Classification:

G06F 19/00

US Classification:

702167, 356489

Abstract:

A computer-implemented method, system, and computer program code are provided for characterizing an edge break, e. g. , part features and/or geometric discontinuities that could give rise to edge sharpness, as may be encountered in a chamfer, bevel, fillet and other part features. The methodology enables to accurately and consistently determine in a manufacturing setting, for example, any applicable geometric parameter for characterizing the edge break.

US Patent:

7888932, Feb 15, 2011

Filed:

Nov 5, 2007

Appl. No.:

11/935118

Inventors:

William Stewart McKnight - Hamilton OH, US
Ui Suh - Cincinnati OH, US
Yuri Plotnikov - Niskayuna NY, US
Changting Wang - Niskayuna NY, US
Ralph Gerald Isaacs - Cincinnati OH, US

Assignee:

General Electric Company - Schenectady NY

International Classification:

G01N 27/82

US Classification:

324242, 324240

Abstract:

A method of assembling an eddy current array probe to facilitate nondestructive testing of a sample is provided. The method includes positioning a plurality of differential side mount coils at least partially within a flexible material. The method also includes coupling the flexible material within a tip portion of the eddy current array probe, such that the flexible material has a contour that substantially conforms to a portion of a surface of the sample to be tested.

US Patent:

7925075, Apr 12, 2011

Filed:

May 7, 2007

Appl. No.:

11/745010

Inventors:

Ming Jia - Shanghai, CN
Guiju Song - Shanghai, CN
Jianming Zheng - Shanghai, CN
Yu Ning - Beijing, CN
Kevin George Harding - Niskayuna NY, US
Gil Abramovich - Niskayuna NY, US
Joseph Benjamin Ross - Cincinnati OH, US
Ralph Gerald Isaacs - Cincinnati OH, US

Assignee:

General Electric Company - Niskayuna NY

International Classification:

G06K 9/00
G06K 9/48
G06C 9/00

US Classification:

382149, 382145, 382199, 702150

Abstract:

A method for inspecting a feature of a part is provided. The method includes obtaining a profile corresponding to the feature using a sensor and projecting the profile onto a compensation plane normal to the feature for generating an updated profile. The method also includes using the updated profile for reducing a measurement error caused by an orientation of the sensor. An inspection system is also provided. The inspection system includes a sensor configured to capture a fringe image of a feature on a part. The inspection system further includes a processor configured to process the fringe image to obtain an initial profile of the feature and to project the initial profile onto a compensation plane normal to the feature.

US Patent:

8045181, Oct 25, 2011

Filed:

May 21, 2009

Appl. No.:

12/469893

Inventors:

Gil Abramovich - Niskayuna NY, US
Kevin George Harding - Niskayuna NY, US
Ralph Gerald Isaacs - Cincinnati OH, US
Guiju Song - Shanghai, CN
Joseph Benjamin Ross - Cincinnati NY, US
Jianming Zheng - Shanghai, CN

Assignee:

General Electric Company - Niskayuna NY

International Classification:

G01B 11/24

US Classification:

356601

Abstract:

An inspection system is provided. The inspection system comprises a light source, a grating, a phase shifting unit, an imager, and a processor. The light source is configured to generate light. The grating is in a path of the generated light and is configured to produce a grating image after the light passes through the grating. The phase shifting unit is configured to form and reflect a plurality of phase shifted patterns of the grating image onto an object surface to form a plurality of projected phase shifting patterns. The imager is configured to obtain image data of the projected phase shifted patterns. The processor is configured to reconstruct the object surface from the image data. An inspection method and a phase shifting projector are also presented.

US Patent:

20080159477, Jul 3, 2008

Filed:

Dec 29, 2006

Appl. No.:

11/618160

Inventors:

Thomas William Birdwell - Middletown OH, US
Ralph Gerald Isaacs - Cincinnati OH, US
Joseph M. Portaz - Wayne Township OH, US
Ronald Cecil McFarland - Cincinnati OH, US

Assignee:

GENERAL ELECTRIC COMPANY - Schenectady NY

International Classification:

G01N 23/04

US Classification:

378 58

Abstract:

A method of radiographic inspection of an object includes the steps of: providing a radiation source and a radiation detector located on opposite sides of the object; positioning the radiation detector to receive radiation transmitted through the object from the radiation source; radiographically imaging an region of interest of the object with the radiation source and the radiation detector, using an set of initial imaging parameters, to produce a test image; obtaining at least one quality measurement of the test image; comparing the quality measurement to predetermined image quality limits; and in response to the quality measurement exceeding the predetermined image quality limits, changing at least one of the initial imaging parameters to generate a new set of image parameters. The process may be repeated iteratively until a final set of imaging parameters is obtained.

US Patent:

6167110, Dec 26, 2000

Filed:

Nov 3, 1997

Appl. No.:

8/963519

Inventors:

Gerorge Edward Possin - Niskayuna NY
Andrew Joseph Galish - West Chester OH
Ralph Gerald Isaacs - Cincinnati OH
Douglas Albagli - Clifton Park NY
Thomas William Birdwell - Middletown OH
Francis Howard Little - Cincinnati OH
Sung Su Han - Niskayuna NY

Assignee:

General Electric Company - Schenectady NY

International Classification:

H05G 160

US Classification:

378 19

Abstract:

A detector (20) for high voltage x-rays includes a plurality of sensor elements (22) with each sensor element being aligned along a respective focal axis (25) with respect to a high voltage x-ray source (24). A fiber optic scintillator (34) is optically coupled to each of said sensor elements and is disposed to receive incident x-ray radiation passing from the object to be imaged. Optical fibers of the scintillator are positioned such that their optical axes are perpendicular to incident x-rays. Each sensor element has a length along the focal axis sufficiently long for the fibers to absorb substantially all incident x-rays. Each sensor element comprises an array of amorphous silicon photosensors disposed to detect light generated by the scintillator.