Rajiv Giridharagopal

age ~42

from Seattle, WA

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Also known as:

Raj L

Phone and address:: 525 Belmont Ave E APT 3E, Seattle, WA 98102

Connected to:

Rajiv Giridharagopal Phones & Addresses

525 Belmont Ave E APT 3E, Seattle, WA 98102
Portland, OR
2120 El Paseo St, Houston, TX 77054
Plano, TX
Planada, CA
Austin, TX
1724 SE Mulberry Ave, Portland, OR 97214

Work

Company:

Intel corporation
Sep 2012 to May 2015
Position:

Probing microscopy tool development engineer

Education

Degree:

Doctorates, Doctor of Philosophy
School / High School:

Rice University
2007 to 2009
Specialities:

Electrical Engineering

Skills

Afm • Thin Films • Spectroscopy • Nanotechnology • Scanning Probe Microscopy • Optical Microscopy • Materials • Solar Cells • Characterization • Nanomaterials • Matlab • R&D • Materials Science • Polymers • Design of Experiments • Scanning Electron Microscopy • Electronics • Image Processing • Instrumentation Development • Atomic Force Microscopy • Organic Electronics • Fault Isolation • Sem • Fib

Industries

Nanotechnology

Name / Title

Company / Classification

Phones & Addresses

Rajiv Giridharagopal
Associate

University of Washington
Health Practitioner's Office College/University · Noncommercial Research Organization College/University · Medical Doctor's Office College/University

325 9 Ave, Seattle, WA 98104
206-731-2403, 206-543-2100, 206-731-3000

Resumes

Senior Research Scientist

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Location:

Seattle, WA

Industry:

Nanotechnology

Work:

Intel Corporation Sep 2012 - May 2015
Probing Microscopy Tool Development Engineer
Rice University Aug 2004 - Jul 2009
Graduate Student and Researcher
Applied Research Labs Jun 2003 - Jul 2004
Honors Scholar Intern
University of Washington Jun 2003 - Jul 2004
Senior Research Scientist

Education:

Rice University 2007 - 2009
Doctorates, Doctor of Philosophy, Electrical Engineering Rice University 2004 - 2007
Master of Science, Masters, Electrical Engineering The University of Texas at Austin 2000 - 2004
Bachelors, Bachelor of Science, Electrical Engineering Rice University;Phd, Electrical Engineering;2007 – 2009;
Doctorates, Doctor of Philosophy, Electrical Engineering

Skills:

Afm
Thin Films
Spectroscopy
Nanotechnology
Scanning Probe Microscopy
Optical Microscopy
Materials
Solar Cells
Characterization
Nanomaterials
Matlab
R&D
Materials Science
Polymers
Design of Experiments
Scanning Electron Microscopy
Electronics
Image Processing
Instrumentation Development
Atomic Force Microscopy
Organic Electronics
Fault Isolation
Sem
Fib

Us Patents

Sub-Microsecond-Resolution Probe Microscopy
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US Patent:

20120079630, Mar 29, 2012
Filed:

Sep 14, 2011
Appl. No.:

13/232859
Inventors:

David Ginger - Seattle WA, US
Rajiv Giridharagopal - Seattle WA, US
David Moore - Seattle WA, US
Glennis Rayermann - Seattle WA, US
Obadiah Reid - Denver CO, US
Assignee:

University of Washington through its Center for Commercialization - Seattle WA
International Classification:

G01Q 10/00
US Classification:

850 1
Abstract:

Methods and apparatus are provided herein for time-resolved analysis of the effect of a perturbation (e.g., a light or voltage pulse) on a sample. By operating in the time domain, the provided method enables sub-microsecond time-resolved measurement of transient, or time-varying, forces acting on a cantilever.