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Pieter Geldermans

Deceased

from Grand Rapids, MI

Also known as:
  • Pieter Gelderman
  • Pieter Geldermen
  • Geldermans Pieter
  • Pieter S
Phone and address:
2105 Raybrook St, Grand Rapids, MI 49546
616-956-6157

Pieter Geldermans Phones & Addresses

  • 2105 Raybrook St, Grand Rapids, MI 49546 • 616-956-6157
  • Poughkeepsie, NY
  • Ann Arbor, MI

Us Patents

  • Method Of Fabricating A Chip Interposer

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  • US Patent:
    46177302, Oct 21, 1986
  • Filed:
    Aug 13, 1984
  • Appl. No.:
    6/639988
  • Inventors:
    Pieter Geldermans - Poughkeepsie NY
    Gangadhara S. Mathad - Poughkeepsie NY
  • Assignee:
    International Business Machines Corporation - Armonk NY
  • International Classification:
    H01R 400
  • US Classification:
    29843
  • Abstract:
    Disclosed is a method of fabricating a multichip interposer comprising an insulating support with thin film fine line metallization on one side thereof. A layer of masking material is adhered to in other side and selective areas of the masking material are removed in a desired pattern to expose areas of the support. The exposed areas of the support are then etched until the metallization is reached to form via holes which are subsequently filled with interconnecting metallurgy. Contact pads are then formed around each filled via hole.
  • Probe Device Having Probe Heads And Method Of Adjusting Distances Between Probe Heads

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  • US Patent:
    39639851, Jun 15, 1976
  • Filed:
    Dec 12, 1974
  • Appl. No.:
    5/532079
  • Inventors:
    Pieter Geldermans - Poughkeepsie NY
  • Assignee:
    International Business Machines Corporation - Armonk NY
  • International Classification:
    G01R 3102
  • US Classification:
    324158F
  • Abstract:
    A bar formed of a material having a known coefficient of expansion has probe holders arranged thereon with each of the probe holders being at a selected distance from each of the adjacent probe holders. The distance between adjacent probe holders is selected in accordance with the design distance between adjacent chip sites on a substrate so that the probes in each probe holder will contact the pads of a particular chip site. During processing, the overall dimensions of the substrate can shrink more or less than the design shrinkage so as to shrink the distances between the adjacent chip sites from the design distances. The support bar is heated to a selected temperature at which the probe holders are spaced the design distances. If the substrate has shrunk less than the design shrinkage, then additional heating of the support bar from its selected temperature expands the support bar. If the substrate has shrunk more than the design shrinkage, then the temperature of the support bar is reduced from its selected temperature through reducing the heat applied thereto and applying a suitable coolant.

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