Motilal Agrawal from 11 Cranfield Ave, San Carlos, CA 94070, age 47

Method And Apparatus For Automatically Acquiring Facial, Ocular, And Iris Images From Moving Subjects At Long-Range
view source
US Patent:

20120154536, Jun 21, 2012
Filed:

Feb 17, 2011
Appl. No.:

13/029911
Inventors:

David Stoker - Burlingame CA, US
Cregg Cowan - Mountain View CA, US
Motilal Agrawal - San Carlos CA, US
Jan Edward van der Laan - Palo Alto CA, US
John Brian Burns - Palo Alto CA, US
International Classification:

H04N 5/232
H04N 13/02
H04N 5/228
H04N 7/18
US Classification:

348 46, 348143, 34820899, 348169, 348 78, 348E05045, 348E13074, 348E07085
Abstract:

The present invention relates to a method and apparatus for long-range facial and ocular acquisition. One embodiment of a system for acquiring an image of a subject's facial feature(s) includes a steerable telescope configured to acquire the image of the facial feature(s), a first computational imaging element configured to minimize the effect of defocus in the image of the facial feature(s), and a second computational imaging element configured to minimize the effects of motion blur. In one embodiment, the detecting, the acquiring, the minimizing the effect of the motion, and the minimizing the effect of the defocus are performed automatically without a human input.

Method And Apparatus For Determining Camera Focal Length
view source
US Patent:

20070237417, Oct 11, 2007
Filed:

Oct 14, 2005
Appl. No.:

11/250243
Inventors:

Motilal Agrawal - Mountain View CA, US
International Classification:

G06K 9/40
US Classification:

382255000
Abstract:

A method and apparatus are provided for determining or estimating the focal length of a camera based on a series of images captured by the camera. In one embodiment, a method for determining focal length includes obtaining a plurality of images of a three-dimensional scene from the camera, matching feature points across a subset of the images, deriving a projective reconstruction from the feature point matching, and finally recovering a metric reconstruction from the projective reconstruction in accordance with semidefinite programming. Once the metric reconstruction is recovered, the camera's intrinsic parameters, including focal length, can be estimated.

System For Adaptive Real-Time Facial Recognition Using Fixed Video And Still Cameras
view source
US Patent:

20170032182, Feb 2, 2017
Filed:

Oct 17, 2016
Appl. No.:

15/294786
Inventors:

Krishna V Motukuri - San Mateo CA, US
Motilal Agrawal - San Carlos CA, US
Assignee:

vCognition Technologies Inc. - San Mateo CA
International Classification:

G06K 9/00
Abstract:

A system for facial recognition, consisting of a global database of facial characteristics of known users, a server which accepts from registration pictures taken on a user's camera device, accepts and processes training pictures and videos of other users to enable algorithm improvement, and a static camera which processes user pictures to determine whether the user is a known user or not based on the global database and a local database associated with each static camera.

Method And Apparatus For Conducting Automated Integrated Circuit Analysis
view source
US Patent:

20140172345, Jun 19, 2014
Filed:

Oct 29, 2013
Appl. No.:

14/066111
Inventors:

- Menlo Park NJ, US
Erik Frank Matlin - Los Gatos CA, US
Motilal Agrawal - San Carlos CA, US
James R. Potthast - San Jose CA, US
Neil William Troy - Santa Clara CA, US
Assignee:

SRI International - Menlo Park NJ
International Classification:

G01R 31/28
G01N 21/88
US Classification:

702117
Abstract:

A method and apparatus for scanning an integrated circuit comprising a plurality of time-synchronized laser microscopes, each of which is configured to scan the same field of view of an integrated circuit under test that generates a plurality of images of the integrated circuit under test, a data processor, coupled to the laser scanning microscope, for processing the plurality of images, comprising, a netlist extractor (NE) that produces one or more netlists defining structure of the integrated circuit under test.