A method for plasma processing of semiconductor wafers is provided that reduces plasma-induced damage to the gate dielectric while limiting damage to the wafer from particulates that flake off of the interior surfaces of the reaction chamber. Plasma conditions are maintained in the reaction chamber while the wafer is transferred into the chamber and the plasma process is performed. After the plasma process, while still maintaining plasma conditions, the wafer is cooled to a removal temperature and removed from the reaction chamber.
Electrostatic Chuck Assembly With Capacitive Sense Feature, And Related Operating Method
Jaime Onate - Fremont CA, US Michael Kilgore - Sunnyvale CA, US Jimmy Lam - Fremont CA, US Timothy W. Kueper - Santa Clara CA, US Dan Ye - Sunnyvale CA, US
Assignee:
Novellus Systems, Inc. - San Jose CA
International Classification:
H01L 21/683
US Classification:
361234
Abstract:
A semiconductor workpiece processing system for treating a workpiece, such as a semiconductor wafer, is provided. A related operating control method is also provided. The system includes an electrostatic chuck configured to receive a workpiece, and a clamping voltage power supply coupled to the electrostatic chuck. The electrostatic chuck has a clamping electrode assembly, and the clamping voltage power supply is coupled to the clamping electrode assembly. The clamping voltage power supply includes a direct current (DC) voltage generator configured to generate a DC clamping voltage for the clamping electrode assembly, an alternating current (AC) voltage generator configured to generate an AC excitation signal for the clamping electrode assembly, and a processing architecture coupled to the clamping electrode assembly. The processing architecture is configured to analyze attributes of a workpiece presence signal obtained in response to the AC excitation signal, and, based on the attributes, verify proper/improper positioning of the workpiece relative to the electrostatic chuck.
Electrostatic Chuck Assembly With Capacitive Sense Feature, And Related Operating Method
Jaime Onate - Fremont CA, US Michael Kilgore - Sunnyvale CA, US Jimmy Lam - Fremont CA, US Timothy W. Kueper - Santa Clara CA, US Dan Ye - Sunnyvale CA, US
Assignee:
NOVELLUS SYSTEMS, INC. - San Jose CA
International Classification:
H01L 21/683
US Classification:
361234
Abstract:
A semiconductor workpiece processing system for treating a workpiece, such as a semiconductor wafer, is provided. A related operating control method is also provided. The system includes an electrostatic chuck configured to receive a workpiece, and a clamping voltage power supply coupled to the electrostatic chuck. The electrostatic chuck has a clamping electrode assembly, and the clamping voltage power supply is coupled to the clamping electrode assembly. The clamping voltage power supply includes a direct current (DC) voltage generator configured to generate a DC clamping voltage for the clamping electrode assembly, an alternating current (AC) voltage generator configured to generate an AC excitation signal for the clamping electrode assembly, and a processing architecture coupled to the clamping electrode assembly. The processing architecture is configured to analyze attributes of a workpiece presence signal obtained in response to the AC excitation signal, and, based on the attributes, verify proper/improper positioning of the workpiece relative to the electrostatic chuck.
Chemical Vapor Deposition System Including Dedicated Cleaning Gas Injection
Michael D. Kilgore - Santa Clara CA Wilbert G. M. van den Hoek - Cupertino CA Christopher J. Rau - Milpitas CA Bart J. van Schravendijk - Sunnyvale CA Jeffrey A. Tobin - Mountain View CA Thomas W. Mountsier - San Jose CA James C. Oswalt - Pleasanton CA
Assignee:
Novellus Systems, Inc. - San Jose CA
International Classification:
B65C 326 C23C 1600 H01L 2100
US Classification:
156345
Abstract:
A plasma-enhanced chemical vapor deposition system includes a number of process gas injection tubes and at least one dedicated clean gas injection tube. A plasma is used to periodically clean the interior surfaces of the deposition chamber. The cleaning is made more rapid and effective by introducing the clean gas through the dedicated clean gas injection tube. In this manner the clean gas can be introduced at a relatively high flow rate without detracting from the cleaning of the interior surfaces of the process gas injection tubes. As a separate aspect of this invention, a high-frequency signal is applied to both terminals of the coil during the cleaning process. This produces a plasma, mainly by capacitive coupling, which has a shape and uniformity that are well-suited to cleaning the surfaces of the deposition chamber.
Michael R Kilgore MD 5265 N 23 St STE A, McAllen, TX 78504 956-687-6196 (phone), 956-687-9169 (fax)
Education:
Medical School Univ Del Noreste, Esc De Med, Tampico, Tamaulipas, Mexico Graduated: 1983
Procedures:
Electrocardiogram (EKG or ECG) Pulmonary Function Tests
Conditions:
Acute Pharyngitis Disorders of Lipoid Metabolism Gastritis and Duodenitis Gastroesophageal Reflux Disease (GERD) Hypothyroidism
Languages:
English Spanish
Description:
Dr. Kilgore graduated from the Univ Del Noreste, Esc De Med, Tampico, Tamaulipas, Mexico in 1983. He works in McAllen, TX and specializes in Family Medicine and Occupational Medicine.
Michael Kilgore, chief marketing officer for the Columbia Restaurant Group, owner of Ulele, where Foster worked since last summer, said staffers remained anxious for word about their co-worker and friend.