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Michael A Bayne

age ~76

from Beaverton, OR

Also known as:
  • Michael A Barr
  • Matthew A Bayne
  • Mike Bayne
  • Michael Abarr
  • Andrea M Cuevas
Phone and address:
7318 152Nd Ave, Beaverton, OR 97007
503-643-7579

Michael Bayne Phones & Addresses

  • 7318 152Nd Ave, Beaverton, OR 97007 • 503-643-7579
  • Sherman, TX
  • Spokane, WA
  • Vancouver, WA
  • Portland, OR
  • Seattle, WA
  • Andover, MN
Name / Title
Company / Classification
Phones & Addresses
Michael Bayne
Scientist
Cascade Microtech
Semiconductors · Mfg Electrical Measuring Instruments Wafer Probe Software Services · Mfg Electrical Measuring Instruments · Nonclassifiable Establishments · Mfg Electrical Measuring Instruments Mfg Semiconductors/Related Devices · Mfg Semiconductor Test Equipment · Electrician · Semiconductor and Related Device Manufacturing
2430 NW 206 Ave, Beaverton, OR 97006
9100 SW Gemini Dr, Beaverton, OR 97008
1120 NW Couch St 10, Portland, OR 97209
9831 S 51 St, Phoenix, AZ 85044
503-601-1000, 503-601-1002, 503-601-1909, 503-601-1010

Wikipedia References

Michael Bayne Photo 1

Michael Bayne

Resumes

Michael Bayne Photo 2

President At Southeast Aircraft Sales

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Location:
United States
Michael Bayne Photo 3

Michael Anthony Bayne

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Location:
Portland, OR
Industry:
Nanotechnology
Work:
Portland Nanotech Consultants Aug 2008 - Dec 2014
Consultant, Owner

Portland Community College 2008 - Dec 2014
Instructor

G.loomis, Inc. Aug 2010 - Feb 2012
Process Engineer

Cascade Microtech Apr 1989 - Apr 2008
Thin Film Engineer, Manager, Quality and Reliability Lab Mgr, Eh and S Manager

Tektronix May 1983 - Apr 1989
Process Engineer, Thin Film Fab Manager
Education:
Washington State University 1966 - 1972
Master of Science, Masters, Bachelors, Bachelor of Science, Physics
Kelso High School 1962 - 1966
Skills:
Thin Films
Manufacturing
Materials
Pecvd
Project Management
Pvd
Clean Rooms
Sputtering
Spc
Semiconductors
Photolithography
Electroplating
Physics
Microelectronics
Product Development
Reliability
Leadership
Vacuum
Engineering
Research
Testing
Michael Bayne Photo 4

General Manager

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Industry:
Retail
Work:
Muddy Paws Downtown
General Manager
Michael Bayne Photo 5

Michael Bayne

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Michael Bayne Photo 6

Michael Bayne

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Skills:
Microsoft Excel
Management
Microsoft Office
Powerpoint
Michael Bayne Photo 7

Michael Bayne

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Michael Bayne Photo 8

Michael Bayne

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Michael Bayne Photo 9

Sciencer Of Computers

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Position:
CTO at Three Rings Design
Location:
Seattle, Washington
Industry:
Computer Software
Work:
Three Rings Design since Jun 2011
CTO

Three Rings Design, Inc. Mar 2001 - Sep 2009
CTO

go2Net, Inc. 1996 - 2000
Chief Architect

QUALCOMM 1994 - 1996
Engineer
Education:
University of Washington 2009 - 2010
PhD Program, Computer Science
Rose-Hulman Institute of Technology 1991 - 1994
BS, Computer Science
Languages:
French
Japanese

Us Patents

  • Method For Constructing A Membrane Probe Using A Depression

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  • US Patent:
    6578264, Jun 17, 2003
  • Filed:
    Apr 11, 2000
  • Appl. No.:
    09/546927
  • Inventors:
    Reed Gleason - Portland OR
    Michael A. Bayne - Beaverton OR
    Kenneth Smith - Portland OR
  • Assignee:
    Cascade Microtech, Inc. - Beaverton OR
  • International Classification:
    H01R 4316
  • US Classification:
    29874, 29846, 29876, 29882, 294261, 324715, 324754
  • Abstract:
    A method for constructing a membrane probe that includes providing a substrate, and creating a depression within the substrate. Conductive material is located within the depression and a conductive trace is connected to the conductive material. A membrane is applied to support the conductive material and the substrate is removed from the conductive material.
  • Method For Probing An Electrical Device Having A Layer Of Oxide Thereon

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  • US Patent:
    6708386, Mar 23, 2004
  • Filed:
    Mar 22, 2001
  • Appl. No.:
    09/814593
  • Inventors:
    Reed Gleason - Portland OR
    Michael A. Bayne - Vancouver WA
    Kenneth Smith - Portland OR
    Timothy Lesher - Beaverton OR
    Martin Koxxy - Hillsboro OR
  • Assignee:
    Cascade Microtech, Inc. - Beaverton OR
  • International Classification:
    G01R 100
  • US Classification:
    29593, 29815, 29825, 29827, 438 17
  • Abstract:
    A substrate, preferably constructed of a ductile material and a tool having the desired shape of the resulting device for contacting contact pads on a test device is brought into contact with the substrate. The tool is preferably constructed of a material that is harder than the substrate so that a depression can be readily made therein. A dielectric (insulative) layer, that is preferably patterned, is supported by the substrate. A conductive material is located within the depressions and then preferably lapped to remove excess from the top surface of the dielectric layer and to provide a flat overall surface. A trace is patterned on the dielectric layer and the conductive material. A polyimide layer is then preferably patterned over the entire surface. The substrate is then removed by any suitable process.
  • Membrane Probing System

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  • US Patent:
    6825677, Nov 30, 2004
  • Filed:
    Mar 22, 2001
  • Appl. No.:
    09/814594
  • Inventors:
    Reed Gleason - Portland OR
    Michael A. Bayne - Vancouver WA
    Kenneth Smith - Portland OR
    Timothy Lesher - Beaverton OR
    Martin Koxxy - Hillsboro OR
  • Assignee:
    Cascade Microtech, Inc. - Beaverton OR
  • International Classification:
    G01R 3102
  • US Classification:
    324754
  • Abstract:
    A substrate, preferably constructed of a ductile material and a tool having the desired shape of the resulting device for contacting contact pads on a test device is brought into contact with the substrate. The tool is preferably constructed of a material that is harder than the substrate so that a depression can be readily made therein. A dielectric (insulative) layer, that is preferably patterned, is supported by the substrate. A conductive material islocated within the depressions and then preferably lapped to remove excess from the top surface of the dielectric layer and to provide a flat overall surface. A trace is patterned on the dielectric layer and the conductive material. A polyimide layer is then preferably patterned over the entire surface. The substrate is then removed by any suitable process.
  • Probe Construction Using A Recess

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  • US Patent:
    6860009, Mar 1, 2005
  • Filed:
    Mar 22, 2001
  • Appl. No.:
    09/814584
  • Inventors:
    Reed Gleason - Portland OR, US
    Michael A. Bayne - Vancouver WA, US
    Kenneth Smith - Portland OR, US
    Timothy Lesher - Beaverton OR, US
    Martin Koxxy - Hillsboro OR, US
  • Assignee:
    Cascade Microtech, Inc. - Beaverton OR
  • International Classification:
    H01R043/16
  • US Classification:
    29874, 294261, 29882, 29846, 29876
  • Abstract:
    A method of constructing a probe which includes providing a substrate and creating a first substantially asymmetrical recess within the substrate. A conductive material is located within the recess and a conductive trace is electrically connected with the conductive material. A membrane supports the conductive trace, wherein the conductive material is located between the membrane and the substrate. The substrate is removed from the conductive material.
  • Method For Constructing A Membrane Probe Using A Depression

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  • US Patent:
    7178236, Feb 20, 2007
  • Filed:
    Apr 16, 2003
  • Appl. No.:
    10/418510
  • Inventors:
    Reed Gleason - Portland OR, US
    Michael A. Bayne - Beaverton OR, US
    Kenneth Smith - Portland OR, US
  • Assignee:
    Cascade Microtech, Inc. - Beaverton OR
  • International Classification:
    H01R 43/16
  • US Classification:
    29874, 29876, 29882, 294261, 324754
  • Abstract:
    A method for constructing a membrane probe that includes providing a substrate, and creating a depression within the substrate. Conductive material is located within the depression and a conductive trace is connected to the conductive material. A membrane is applied to support the conductive material and the substrate is removed from the conductive material.
  • Membrane Probing System

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  • US Patent:
    7400155, Jul 15, 2008
  • Filed:
    Feb 3, 2004
  • Appl. No.:
    10/772172
  • Inventors:
    Reed Gleason - Portland OR, US
    Michael A. Bayne - Vancouver WA, US
    Kenneth Smith - Portland OR, US
    Timothy Lesher - Beaverton OR, US
    Martin Koxxy - Hillsboro OR, US
  • Assignee:
    Cascade Microtech, Inc. - Beaverton OR
  • International Classification:
    G01R 31/02
  • US Classification:
    324754, 29874, 29846, 29876, 29882, 294261
  • Abstract:
    A substrate, preferably constructed of a ductile material and a tool having the desired shape of the resulting device for contacting contact pads on a test device is brought into contact with the substrate. The tool is preferably constructed of a material that is harder than the substrate so that a depression can be readily made therein. A dielectric (insulative) layer, that is preferably patterned, is supported by the substrate. A conductive material is located within the depressions and then preferably lapped to remove excess from the top surface of the dielectric layer and to provide a flat overall surface. A trace is patterned on the dielectric layer and the conductive material. A polyimide layer is then preferably patterned over the entire surface. The substrate is then removed by any suitable process.
  • Method Of Constructing A Membrane Probe

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  • US Patent:
    7533462, May 19, 2009
  • Filed:
    Dec 1, 2006
  • Appl. No.:
    11/607156
  • Inventors:
    Reed Gleason - Portland OR, US
    Michael A. Bayne - Beaverton OR, US
    Kenneth Smith - Portland OR, US
  • Assignee:
    Cascade Microtech, Inc. - Beaverton OR
  • International Classification:
    H01R 43/16
    H01R 43/00
  • US Classification:
    29874, 29825, 29846, 29876, 29879
  • Abstract:
    A substrate, preferably constructed of a ductile material and a tool having the desired shape of the resulting device for contacting contact pads on a test device is brought into contact with the substrate. The tool is preferably constructed of a material that is harder than the substrate so that a depression can be readily made therein. A dielectric (insulative) layer, that is preferably patterned, is supported by the substrate. A conductive material is located within the depressions and then preferably lapped to remove excess from the top surface of the dielectric layer and to provide a flat overall surface. A trace is patterned on the dielectric layer and the conductive material. A polyimide layer is then preferably patterned over the entire surface. The substrate is then removed by any suitable process.
  • Membrane Probing System

    view source
  • US Patent:
    7681312, Mar 23, 2010
  • Filed:
    Jul 31, 2007
  • Appl. No.:
    11/888429
  • Inventors:
    Reed Gleason - Portland OR, US
    Michael A. Bayne - Vancouver WA, US
    Kenneth Smith - Portland OR, US
    Timothy Lesher - Beaverton OR, US
    Martin Koxxy - Hillsboro OR, US
  • Assignee:
    Cascade Microtech, Inc. - Beaverton OR
  • International Classification:
    H01R 43/16
  • US Classification:
    29857, 29846, 29876, 29882, 29426, 174253, 174 523
  • Abstract:
    A substrate, preferably constructed of a ductile material and a tool having the desired shape of the resulting device for contacting contact pads on a test device is brought into contact with the substrate. The tool is preferably constructed of a material that is harder than the substrate so that a depression can be readily made therein. A dielectric (insulative) layer, that is preferably patterned, is supported by the substrate. A conductive material is located within the depressions and then preferably lapped to remove excess from the top surface of the dielectric layer and to provide a flat overall surface. A trace is patterned on the dielectric layer and the conductive material. A polyimide layer is then preferably patterned over the entire surface. The substrate is then removed by any suitable process.

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Michael Bayne Photo 10

Michael Bayne

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Michael Bayne Photo 11

Michael Bayne

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Michael Bayne Photo 12

Michael Todd Bayne

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Michael Bayne Photo 13

Michael A Bayne

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Michael Bayne Photo 14

Michael Bayne

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Michael Bayne Photo 15

Michael Bayne

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Michael Bayne Photo 16

Michael Bayne

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Michael Bayne Photo 17

Michael J. Bayne

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Youtube

D.Michael Bayne

Acting Reel

  • Category:
    Film & Animation
  • Uploaded:
    24 May, 2009
  • Duration:
    2m 20s

GWT Developers - Whirled

Michael Bayne of Three Rings talks about Whirled, a social virtual wor...

  • Category:
    Education
  • Uploaded:
    09 Dec, 2008
  • Duration:
    2m 40s

2009 Kroger 200 - Trevor Bayne / Steve Wallac...

After Michael Annett crashes, the pace car comes out early, causing ra...

  • Category:
    Sports
  • Uploaded:
    25 Jul, 2009
  • Duration:
    2m 53s

Trevor Bayne learning Daytona

Last year (2010) during Speedweeks, Trevor Bayne, Michael Waltrip, Her...

  • Category:
    Sports
  • Uploaded:
    21 Feb, 2011
  • Duration:
    1m 26s

Trevor Bayne's first Daytona victory....

Last year (2010) during Speedweeks, Trevor Bayne, Michael Waltrip, Her...

  • Category:
    Sports
  • Uploaded:
    21 Feb, 2011
  • Duration:
    2m 16s

Trevor Bayne talks with Catie from Toyota Mot...

Trevor discusses Phoenix, Bristol, Nashville and racing in his home st...

  • Category:
    Sports
  • Uploaded:
    05 Mar, 2010
  • Duration:
    2m 51s

TBayne Got Mad Yo Yo Skills, Yo.

Trevor Bayne gives Michael McDowell a quick yo-yo lesson while the cre...

  • Category:
    Entertainment
  • Uploaded:
    25 Feb, 2011
  • Duration:
    1m 36s

Trevor Bayne highlights from Las Vegas Motor ...

2010 Sam's Town 300

  • Category:
    Sports
  • Uploaded:
    02 Mar, 2010
  • Duration:
    1m 50s

Myspace

Michael Bayne Photo 18

Michael Bayne

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Locality:
I T L, North Crime-a-lina
Gender:
Male
Birthday:
1948
Michael Bayne Photo 19

Michael Bayne

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Locality:
clarksville, Tennessee
Gender:
Male
Birthday:
1934
Michael Bayne Photo 20

Michael Bayne

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Locality:
Adelaide, South Australia
Gender:
Male
Birthday:
1947
Michael Bayne Photo 21

michael bayne

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Locality:
ESSEX, MARYLAND
Gender:
Male
Birthday:
1936
Michael Bayne Photo 22

Michael Bayne

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Locality:
ELIZABETHTOWN, Maine
Gender:
Male
Birthday:
1940
Michael Bayne Photo 23

Michael Bayne

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Locality:
Basildon, London and South East
Gender:
Male
Birthday:
1949

Classmates

Michael Bayne Photo 24

Michael Bayne

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Schools:
St. Mary's High School Chicago IL 1983-1987
Community:
Angie Golik, Reda Caldwell, Josephine Falbo, Toni Punzio
Michael Bayne Photo 25

Michael Bayne

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Schools:
Kelso High School Kelso WA 1962-1966
Community:
Daun Conner, Judith Bushman
Michael Bayne Photo 26

michael bayne, Abraxas Hi...

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Michael Bayne Photo 27

Michael Bayne | Rising Su...

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Michael Bayne Photo 28

Mont Lasalle High School,...

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Graduates:
Gary Shouse (1960-1964),
Jay Burch (1958-1962),
Michael Bayne (1963-1967),
David Rodrigues (1959-1963)
Michael Bayne Photo 29

Abraxas High School, Powa...

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Graduates:
michael bayne (1974-1978),
Heather Bell (1990-1994),
Michael Fuller (1999-2003),
Jodi Crutcher (1984-1988),
Naomi Murray (1974-1978),
Terry Ward (1973-1977)
Michael Bayne Photo 30

Innisfail High School, In...

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Graduates:
Mike Bayne (1999-2003),
Ashley Sharpe (1991-1995),
Mark Dreeshen (1999-2003),
Susan Kennedy (1974-1978)
Michael Bayne Photo 31

Paterson City Elementary ...

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Graduates:
Carl de Prospo (1940-1944),
Rasheem Weeks (1991-1995),
Alejandro Cruz (1993-1997),
Michael Bayne (1956-1960),
Jonathan Palomino (2001-2005)

Googleplus

Michael Bayne Photo 32

Michael Bayne

Work:
Simpson's Produce - Slave (2010)
Education:
Guilford Technical Community College - Aviation systems technology
About:
I am 21. I work, work out, skateboard and just like to have fun. If it's dangerous, I am down. I like to travel and am moving to Greensboro soon to start school to be an airplane mechanic.
Tagline:
21 and on the go
Bragging Rights:
I've survived the end of the world several times
Michael Bayne Photo 33

Michael Bayne

Work:
Bayne.inc - Bayner (2025)
Education:
North broadway - Baynerology
Michael Bayne Photo 34

Michael Bayne

Michael Bayne Photo 35

Michael Bayne

Michael Bayne Photo 36

Michael Bayne

Michael Bayne Photo 37

Michael Bayne

Michael Bayne Photo 38

Michael Bayne

Michael Bayne Photo 39

Michael Bayne

Flickr

Plaxo

Michael Bayne Photo 48

Michael Bayne

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SeattlePast: CTO at Three Rings
Michael Bayne Photo 49

Michael Baynes

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France
Michael Bayne Photo 50

Michael Bayne

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Beaverton, OR
Michael Bayne Photo 51

Michael Bayne

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Ocean Springs, MS

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