Matthew Brett Baillie

age ~63

from Emmaus, PA

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Also known as:

Matthew B Baillie
Matthew B Baille
Brett Baillie
Brett Baille

Phone and address:: 129 Pine St, Emmaus, PA 18049
610-967-1153

Connected to:

Matthew Baillie Phones & Addresses

129 Pine St, Emmaus, PA 18049 • 610-967-1153
Ocean Grove, NJ
Whitehall, PA
Orlando, FL
Easton, PA
129 Pine St, Emmaus, PA 18049

Work

Position:

Building and Grounds Cleaning and Maintenance Occupations

Education

Degree:

Graduate or professional degree

Isbn (Books And Publications)

The Influence of Matthew Baillie's Morbid Anatomy: Biography, Evaluation, and Reprint

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Author
Matthew Baillie

ISBN #
0398027811

Wikipedia

Matthew Baillie

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Matthew Baillie (born 27 October 1761, Shots Manse, Lanarkshire, Scot. died 23 September 1823, Duntisbourne, Gloucestershire, England) was a Scottish

Matthew Baillie Begbie

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Sir Matthew Baillie Begbie (9 May 1819 11 June 1894) was born on the island of Mauritius, thereafter raised and educated in the United Kingdom.

License Records

Matthew Baillie

License #:

52310 - Active

Category:

Professional

Issued Date:

Apr 26, 2011

Expiration Date:

Jun 30, 2017

Us Patents

Integrated Circuit Carrier And Method Of Manufacturing And Integrated Circuit
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US Patent:

7023087, Apr 4, 2006
Filed:

Aug 21, 1998
Appl. No.:

09/138146
Inventors:

Matthew Brett Baillie - Emmaus PA, US
Gary John Reichl - Coopersburg PA, US
Assignee:

Agere Systems Inc. - Allentown PA
International Classification:

H01L 23/12
US Classification:

257730, 257678, 206710
Abstract:

A process for manufacturing an integrated circuit including the steps of providing a chip carrier including a base, an inner well formed about the periphery of the base, and an outer well formed about the periphery of the inner well. An integrated circuit is positioned on the base. The process further includes the steps of pre or post processing the integrated circuit.

Method For Measuring Surface Resistivity Using Square Electrodes And Multiplying Surface Resistance Measurements By A Correction Factor
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US Patent:

53919947, Feb 21, 1995
Filed:

Dec 31, 1992
Appl. No.:

7/999079
Inventors:

Matthew B. Baillie - Emmaus PA
Ming-Chung Jon - Princeton Junction NJ
Assignee:

AT&T Corp. - Murray Hill NJ
International Classification:

G01R 2714
G01N 2704
US Classification:

324717
Abstract:

This invention embodies a method and apparatus for determination of surface resistivity (. rho. ) of materials to be used for a desired purpose. The surface resistivity is obtained by measuring surface resistance (R) of at least one square area of the material, and converting the surface resistance into a surface resistivity (. rho. ) by a correction factor K (K=. rho. /R) whenever the total area of the material is greater than three square area. The surface resistance is measured by placing a pair of square electrodes, spaced from each other a distance equal to the side of the square, applying measuring voltage potential to the electrodes, and determining the surface resistance of said at least one square area. The surface resistivity of materials of any size can be obtained by multiplying the surface resistance value by a correction factor determined for the size of the material being investigated. The surface resistivity may be confirmed by cutting out three square long areas of the material and measuring the surface resistivity of each separate three square area, resulting in simultaneous surface resistivity measurement.