Everspin Technologies May 2015 - Apr 2017
Distinguished Member of Technical Staff
Cadence Design Systems May 2015 - Apr 2017
Solutions Architect
Everspin Technologies Mar 2015 - May 2015
Consultant
Barkatech Consulting Jan 2010 - May 2015
Founder and Chief Engineer
Gobenow Apr 2011 - Dec 2013
Chief Executive Officer and Co-Founder
Education:
Willamette University - Atkinson Graduate School of Management 2010 - 2012
MBA, Sustainable Enterprise and Entrepreneurship
University of Iowa 1987 - 1992
MS, Ph.D, Electrical & Computer Engineering
Bangladesh University of Engineering and Technology 1981 - 1985
BS, Electrical & Electronics Engineering
Skills:
Microprocessors Verilog Processors Asic Integrated Circuit Design Circuit Design Project Management Mixed Signal Simulations Soc Semiconductor Industry New Business Development Ic Clocking Semiconductors Application Specific Integrated Circuits Start Ups New Technology Development High Speed Design Debugging Rtl Design Hardware Architecture High Speed Circuit Design Microprocessor Clocking Mixed Signal Circuit Design Stereoscopic and Autostereoscopic Video System Software Design and Development Systemverilog 16Nm Design Vlsi System on A Chip 2D To 3D Conversion Functional Verification Open Verification Methodology Eda Algorithms Bitcoin Mining Cryptography Finfet Tcl Physical Design Cross Functional Team Leadership Microarchitecture
Interests:
Human Rights Science and Technology Environment Disaster and Humanitarian Relief
Thomas D. Fletcher - Portland OR Javed S. Barkatullah - Portland OR Douglas Carmean - Beaverton OR
Assignee:
Intel Corporation - Santa Clara CA
International Classification:
G06F 132
US Classification:
713322, 713320, 713324
Abstract:
A hierarchical power control system for an integrated circuit may be integrated into a clocking system that includes a global clock generator, a clock distribution network in communication with the global clock generator and a plurality of functional unit blocks each in communication with the global clock generator. The hierarchical power control system may include a first power controller provided in a communication path between the global clock generator and the clock distribution network, and a plurality of second power controllers, one provided in each communication path between the clock distribution network and a functional unit block.
Nasser A. Kurd - Hillsboro OR Javed Barkatullah - Portland OR
Assignee:
Intel Corporation - Santa Clara CA
International Classification:
G06F 112
US Classification:
713503, 713401
Abstract:
A skew measure circuit, an exclusion circuit, and an up/down counter are connected to form a skew detection circuit. The skew measure circuit asserts a first output signal if a first input clock leads a second input clock, and asserts a second output signal if the second clock leads the first clock. The exclusion circuit provides first and second digital pulse signals that represent the outputs of the skew measure circuit. The exclusion circuit also prevents the states of these pulse signals from changing, so long as the skew measure circuit is experiencing metastability. The up/down counters count is incremented in response to the first pulse signal and decremented in response to the other pulse signal.
Generating A 2-Phase Clock Using A Non-50% Divider Circuit
Javed S. Barkatullah - Portland OR Thomas D. Fletcher - Portland OR
Assignee:
Intel Corporation - Santa Clara CA
International Classification:
G06F 104
US Classification:
713500, 713401, 713503, 327100
Abstract:
A logic circuit is disclosed having a digital divider that is capable of generating an intermediate signal in response to an input digital clock signal having a 50% duty cycle, where the intermediate signal has a non-50% duty cycle. First and second output signals are generated by a digital delay circuit in response to the intermediate signal. In the digital delay circuit, the first output signal is delayed by an odd number of substantially identical inverter delays, while the second output signal is delayed by an even number of inverter delays. Such a circuit helps reduce and perhaps minimize the sensitivity of the relative phase difference between the output signals to variations in temperature, supply voltage, and fabrication process parameters. When generated locally, this 2-phase clock does not require the distribution of two clock signals throughout the integrated circuit die or printed wiring board, but rather just one, thereby simplifying both the layout of the circuit as well as the control of clock accuracy in the system.
Automated Clock Alignment For Testing Processors In A Bypass Mode
Nasser A. Kurd - Hillsboro OR Javed S. Barkatullah - Portland OR Tim Frodsham - Portland OR David J. OBrien - Portland OR
Assignee:
Intel Corporation - Santa Clara CA
International Classification:
G01R 3128
US Classification:
714724, 327163, 709400
Abstract:
In a bypass mode, a tester may bypass the core and input/output phase locked loops (PLLs) utilized by a processor to develop internal clock signals. External, tester-generated, phase shifted clock signals may be used to generate aligned high frequency signals to replace those generated by the phase locked loops. A plurality of phase shifted, tester generated clock signals may be subjected to an exclusive OR operation for generating input/output and core clock replacement signals. The clock signals received from the tester may also be aligned. Thus, a variety of skews may be compensated before entering the bypass mode. In some embodiments of the present invention, the core and I/O PLL clocks are used to establish alignment in a set-up phase and in other embodiments, the core and I/O PLL need not be utilized at all to generate appropriate internal clock signals from an external tester.
Method And Apparatus For Correcting A Clock Duty Cycle In A Clock Distribution Network
Thomas D. Fletcher - Portland OR Javed S. Barkatullah - Portland OR
Assignee:
Intel Corporation - Santa Clara CA
International Classification:
H03K 3017
US Classification:
327175, 327155, 327291
Abstract:
A clock duty cycle correction circuit. The duty cycle correction circuit is located at a receiver in a clock distribution network to correct a duty cycle of a distributed clock signal.
Method And Apparatus For Detecting On-Die Voltage Variations
Nasser A. Kurd - Portland OR, US Javed S. Barkatullah - Portland OR, US
Assignee:
Intel Corporation - Santa Clara CA
International Classification:
H03B001/00
US Classification:
331186, 331185, 331 74
Abstract:
On-die voltage and/or frequency detectors. For one aspect, an adaptive frequency clock generation circuit includes a droop detector to detect a supply voltage level and to cause the frequency of an on-die clock signal to be adjusted accordingly.