Eugene O Tuv from 295 Rural Rd, Chandler, AZ 85226, age 64, Phone: 480-621-6236

Method For Classifying Microelectronic Dies Using Die Level Cherry Picking System Based On Dissimilarity Matrix
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US Patent:

7930266, Apr 19, 2011
Filed:

Mar 9, 2006
Appl. No.:

11/372610
Inventors:

Eugene Tuv - Chandler AZ, US
Somnath Shahapurkar - Chandler AZ, US
Alexander Borisov - Novgorod, RU
Assignee:

Intel Corporation - Santa Clara CA
International Classification:

G06F 17/10
US Classification:

706 62, 703 2
Abstract:

A computer implemented method for ordering a plurality of entities by computing a dissimilarity matrix based on a plurality of probabilities. The pluralities of probabilities are determined based on a plurality of classes. A weighted distance matrix is computed based the dissimilarity matrix. A plurality of rank ordered sequence candidates based at least in part on the sum of weighted distances between neighboring entities in the rank ordered sequence is calculated. Other embodiments are described in the claims.

Processing Of High-Dimensional Categorical Predictors In Classification Settings
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US Patent:

7933851, Apr 26, 2011
Filed:

Apr 30, 2004
Appl. No.:

10/837246
Inventors:

Eugene Tuv - Chandler AZ, US
Assignee:

Intel Corporation - Santa Clara CA
International Classification:

G06N 5/00
US Classification:

706 45
Abstract:

Systems and methods provide for preprocessing non-metric response categories in order to efficiently cluster or partition predictors have similar responses. The non-metric response categories are transformed into distance vectors by calculating a frequency count for the response, transforming the frequency count to a proportional value, and calculating a distance vector using the vector of proportional values.

Classification Of Spatial Patterns On Wafer Maps
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US Patent:

7937234, May 3, 2011
Filed:

Aug 29, 2008
Appl. No.:

12/201615
Inventors:

Eric R. St. Pierre - Chandler AZ, US
Eugene Tuv - Chandler AZ, US
Alexander Borisov - Nizhny Novgorod, RU
Assignee:

Intel Corporation - Santa Clara CA
International Classification:

G06F 19/00
US Classification:

702 81, 702 33, 702 35, 702 36, 702 82, 702 83, 702 84, 438 14, 438 15
Abstract:

Classification of spatial patterns on wafer maps is generally described. In one example, a method includes applying K-means type clustering to wafer maps comprising one or more spatial patterns to group one or more clusters comprising wafer maps having similar spatial patterns and producing a dendrogram using a clustering process to display the one or more clusters.

Apparatus And Method For Determining The Minimum Zone For An Array Of Features With A True Position Tolerance
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US Patent:

20070078630, Apr 5, 2007
Filed:

Sep 30, 2005
Appl. No.:

11/239764
Inventors:

Anatoly Filatov - Nizhni, RU
Robert Guderian - Gilbert AZ, US
Eugene Tuv - Chandler AZ, US
International Classification:

G06F 15/00
US Classification:

702189000
Abstract:

A method and apparatus for determining the minimum zone for an array of features with a true position tolerance. In one embodiment, a target function is defined according to a deviation value of each of at least two features from an array of features having a maximum deviation between an actual position and a nominal position. Once defined, the target function is minimized to determine a rotation parameter, a horizontal translation parameter and a vertical translation parameter that provide a minimum target function value as a minimum of the maximum deviation for the array of features. In one embodiment, an inspection report may be generated for the array of features, including at least the minimum, maximum deviation value, as well as the rotation parameter, the horizontal translation parameter and the vertical translation parameter that provide the minimum target function value. Other embodiments are described and claimed.