Raymond Albert Fillion - Niskayuna NY Ernest Wayne Balch - Ballston Spa NY Ronald Frank Kolc - Cherry Hill NJ Robert John Wojnarowski - Ballston Lake NY Leonard Richard Douglas - Burnt Hills NY Thomas Bert Gorczyca - Schenectady NY
Assignee:
General Electric Company - Schenectady NY
International Classification:
H01L 2348
US Classification:
257774, 257773
Abstract:
One method for packaging at least one circuit chip includes: providing an interconnect layer including insulative material having a first side and a second side, initial metallization patterned on second side metallized portions of the second side and not on second side non-metallized portions of the second side, at least one substrate via extending from the first side to one of the second side metallized portions, and at least one chip via extending from the first side to one of the second side non-metallized portions; positioning the at least one circuit chip on the second side with at least one chip pad of the at least one circuit chip being aligned with the at least one chip via; and patterning connection metallization on selected portions of the first side of the interconnect layer and in the vias so as to extend to the at least one second side metallized portion and to the at least one chip pad. In related embodiments vias are pre-metallized and coupled to chip pads of the circuit chips by an electrically conductive binder. Thin film passive components and multilayer interconnections can additionally be incorporated into the package.
Silicon Carbide Large Area Device Fabrication Apparatus And Method
A method for interconnecting high-temperature silicon carbide (SiC) devices enables such high-temperature devices to be used in fabricating electronic circuits of significant scale. This method comprises empirically measuring operational characteristics of a plurality of the devices to be interconnected, the operational characteristics comprising devices which are measured to be non-working and devices which are measured to be working; characterizing the operational characteristics in an operational characteristics map; designing interconnection paths between and among the devices that are characterized to be working by the operational characteristics map; and excluding from the interconnection paths, devices that are characterized to be non-working by the operational characteristics map. A preferred embodiment of this method further includes disposing a temporary polymer layer over the devices; forming via holes through the temporary polymer layer, to bonding pads of the devices; applying a current-balancing resistive metal over the temporary polymer layer; establishing connections between the current-balancing resistive metal and the bonding pads; designing the interconnection paths between and among the working devices by patterning the current-balancing resistive metal based on the operational characteristics map; and removing the temporary polymer layer.
Donald Franklin Foust - Glenville NY James Wilson Rose - Guilderland NY Ernest Wayne Balch - Ballston Spa NY
Assignee:
General Electric Company - Niskayuna NY
International Classification:
H01L 2120
US Classification:
438384, 438382, 438686, 438785, 427534
Abstract:
A method of forming a ruthenium dioxide film for such purposes as the fabrication of stable thin-film resistors for microcircuits. The method generally entails forming an inorganic ruthenium-based film on a substrate, and then thermally decomposing at least a portion of the ruthenium-based film by exposure to a high-intensity beam of radiation, preferably visible light, to yield a ruthenium dioxide film on the substrate. Particular ruthenium-based precursors useful for forming the ruthenium-based film include ruthenium (III) chloride (RuCl. nH O) and ruthenium (III) nitrosyl nitrate. The method does not require a thermal treatment that heats the bulk of the substrate on which the ruthenium dioxide film is formed, and is therefore suitable for non-ceramic substrate materials, e. g. , polymers such as those used as printed circuit boards (PCBs) and flexible circuits.
Method For Making Multichip Module Substrates By Encapsulating Electrical Conductors And Filling Gaps
James Wilson Rose - Guilderland NY Thomas Bert Gorczyca - Schenectady NY Christopher James Kapusta - Duanesburg NY Ernest Wayne Balch - Ballston Spa NY Kevin Matthew Durocher - Waterford NY
Assignee:
Lockheed Martin Corporation - Bethesda MD
International Classification:
H01L 2144
US Classification:
438126, 438106, 438109, 438125
Abstract:
A method for making a multichip âHDIâ module includes the step of making a substrate for supporting the semiconductor or solid-state chips (or other components) by applying electrical conductor in a pattern to a first dielectric sheet, and applying encapsulating material to the electrical conductor. Apertures are made in the first dielectric sheet and encapsulant at locations at which the chips (or other components) are to be located. The components are affixed to a second dielectric sheet at locations registered with the apertures in the first sheet, and the sheets are juxtaposed with the chips extending into the apertures. This results in the formation of gaps between the components and the edges of the apertures, which gaps are then filled with hardenable or curable material. Electrical connection is made to the pads of the chips by means of a multilayer structure of dielectric sheets with conductor patterns, interconnected by means of plated-through vias.
Robert John Wojnarowski - Ballston Lake NY Ernest Wayne Balch - Ballston Spa NY Leonard Richard Douglas - Burnt Hills NY
Assignee:
General Electric Company - Niskayuna NY
International Classification:
H01L 310312
US Classification:
257 77, 257744, 257773
Abstract:
A method for interconnecting high-temperature silicon carbide (SiC) devices enables such high-temperature devices to be used in fabricating electronic circuits of significant scale. This method comprises empirically measuring operational characteristics of a plurality of the devices to be interconnected, the operational characteristics comprising devices which are measured to be non-working and devices which are measured to be working; characterizing the operational characteristics in an operational characteristics map; designing interconnection paths between and among the devices that are characterized to be working by the operational characteristics map; and excluding from the interconnection paths, devices that are characterized to be non-working by the operational characteristics map. A preferred embodiment of this method further includes disposing a temporary polymer layer over the devices; forming via holes through the temporary polymer layer, to bonding pads of the devices; applying a current-balancing resistive metal over the temporary polymer layer; establishing connections between the current-balancing resistive metal and the bonding pads; designing the interconnection paths between and among the working devices by patterning the current-balancing resistive metal based on the operational characteristics map; and removing the temporary polymer layer.
Kevin Matthew Durocher - Waterford NY Ernest Wayne Balch - Ballston NY Vikram B. Krishnamurthy - Clifton Park NY Richard Joseph Saia - Niskayuna NY Herbert Stanley Cole - Burnt Hills NY Ronald Frank Kolc - Cherry Hill NJ
There is provided a flexible circuit module, including at least one rigid carrier, at least one solid state device mounted over a first side of the at least one rigid carrier, a flexible base supporting a second side of the at least one rigid carrier, a conductive interconnect pattern on the flexible base, and a plurality of feed through electrodes extending from the first side to the second side of the at least one rigid carrier and electrically connecting the conductive interconnect pattern with the at least one of a plurality of the solid state devices. The solid state devices may be LED chips to form an LED array module.
Kevin Matthew Durocher - Waterford NY Ernest Wayne Balch - Ballston NY Vikram B. Krishnamurthy - Clifton Park NY Richard Joseph Saia - Niskayuna NY Herbert Stanley Cole - Burnt Hills NY Ronald Frank Kolc - Cherry Hill NJ
Assignee:
General Electric Company - Schenectady NY
International Classification:
H01L 2100
US Classification:
438 26, 438106, 438118, 438119, 438125, 438126
Abstract:
There is provided a flexible circuit module, including at least one rigid carrier, at least one solid state device mounted over a first side of the at least one rigid carrier, a flexible base supporting a second side of the at least one rigid carrier, a conductive interconnect pattern on the flexible base, and a plurality of feed through electrodes extending from the first side to the second side of the at least one rigid carrier and electrically connecting the conductive interconnect pattern with the at least one of a plurality of the solid state devices. The solid state devices may be LED chips to form an LED array module.
Kevin Matthew Durocher - Waterford NY Ernest Wayne Balch - Ballston NY Vikram B. Krishnamurthy - Clifton Park NY Richard Joseph Saia - Niskayuna NY Herbert Stanley Cole - Burnt Hills NY Ronald Frank Kolc - Cherry Hill NJ
Assignee:
General Electric Company - Schenectady NY
International Classification:
B29C 4514
US Classification:
26427214, 26427217, 26427215, 29846, 29854, 29855
Abstract:
There is provided a flexible circuit module, including at least one rigid carrier, at least one solid state device mounted over a first side of the at least one rigid carrier, a flexible base supporting a second side of the at least one rigid carrier, a conductive interconnect pattern on the flexible base, and a plurality of feed through electrodes extending from the first side to the second side of the at least one rigid carrier and electrically connecting the conductive interconnect pattern with the at least one of a plurality of the solid state devices. The solid state devices may be LED chips to form an LED array module.
Dr. Reginald Ernest Balch (December 29, 1894 1994) was a Canadian ... Alfred Earnest Balch and Sarah Hawkes. He was educated at Bedford Grammar School and ...