Technologies are described herein for mitigating the effects of single event effects or upsets on digital semiconductor device data paths and clocks utilizing an adaptive temporal filter. The adaptive temporal filter includes a master delay line and a slave delay line to generate two output clock signals that remain unaffected by variations in process, voltage and temperature (PVT) conditions. The adaptive temporal filter supplies the three independent clock signals having a programmable phase relationship, to a triple voting register structure for storing and outputting an uncorrupted data value using a majority voter.