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Todd A Albertson

age ~51

from Portland, OR

Also known as:
  • Todd Andrew Albertson

Todd Albertson Phones & Addresses

  • Portland, OR
  • Venice, CA
  • Las Vegas, NV
  • Tempe, AZ
  • Savannah, GA
  • Glendale, AZ
  • 8337 Ne Broadway St, Portland, OR 97220

Us Patents

  • Systems And Methods For Application Of Rigid And Flexible Adhesives For Cable Attachment To Bgas

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  • US Patent:
    20220313069, Oct 6, 2022
  • Filed:
    Jun 21, 2022
  • Appl. No.:
    17/845006
  • Inventors:
    - Scottsdale AZ, US
    Todd Albertson - Portland OR, US
  • International Classification:
    A61B 1/00
    H01R 12/65
    H01R 13/405
    H01R 13/52
    H01B 7/20
    H01B 7/02
    H01B 3/44
    H01B 13/06
    H01B 13/004
  • Abstract:
    A cable assembly, comprising a component, a cable, a rigid adhesive and a flexible adhesive. The cable may be coupled to the component. The rigid adhesive may be applied to cover the connection of the cable to the component. The flexible adhesive may be applied to cover the rigid adhesive. The component may comprise a ball grid array (BGA) and the cable may be coupled to the BGA. A hypodermic tubing may be applied over a portion of the rigid adhesive.
  • Methods And Apparatus For Flex Circuit And Cable Attachment System

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  • US Patent:
    20210153344, May 20, 2021
  • Filed:
    Jan 28, 2021
  • Appl. No.:
    17/160675
  • Inventors:
    - Scottsdale AZ, US
    Todd Albertson - Portland OR, US
  • International Classification:
    H05K 1/02
    H01R 12/59
    H05K 1/03
  • Abstract:
    A foldable modular flex circuit for attaching to at least one component. The flex circuit may comprise a central area and at least one tab depending from the central area. The central area may comprise a cable attachment section configured to electrically couple to at least one coaxial cable. A first tab may depend from the central area and is configured to electrically couple to a ball grid array (BGA) of the component. A second pair of tabs may depend from the central area and are configured to electrically couple to an additional at least one component, wherein each tab depends substantially perpendicular from the central area.
  • Methods And Apparatus For Cable Attachment System

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  • US Patent:
    20210052142, Feb 25, 2021
  • Filed:
    Aug 23, 2020
  • Appl. No.:
    17/000333
  • Inventors:
    - Scottsdale AZ, US
    Todd Albertson - Portland OR, US
  • International Classification:
    A61B 1/00
    A61M 39/08
    A61M 39/10
    A61B 1/05
    A61B 1/045
  • Abstract:
    A cable attachment system and method for use with micro sensing component in a sterile environment. The cable attachment system may comprise a sensor, a cable connected to the sensor at a first end, a connector coupled to a second end of the cable, and a board coupled to the connector. A medical grade tubing may encase the connection of the sensor to the cable and a medical grade housing may encase the connection of the board to the connector and connected to the tubing. The medical grade housing and tubing are configured to create a sealed internal volume in the sterile environment.
  • Methods And Apparatus For Rf Shield And Cable Attachment System

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  • US Patent:
    20210050691, Feb 18, 2021
  • Filed:
    Aug 4, 2020
  • Appl. No.:
    16/984649
  • Inventors:
    - Scottsdale AZ, US
    Todd Albertson - Portland OR, US
  • International Classification:
    H01R 13/6581
    H01R 13/24
    H01R 13/6598
    H05K 3/34
    H01R 12/52
  • Abstract:
    A shield for a cable attachment system for attaching a cable to a component having a ball grid array (BGA). The shield may comprise an outer conductive surface, a first end configured to be coupled to a surface of the component, a second end that receives the cable, and an inner non-conductive material received within the shield adjacent the first end and encasing the connection of the cable to the BGA of the component. The cable may be configured to be coupled to the BGA of the component.
  • Probe Head And Electronic Device Testing System

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  • US Patent:
    20200309818, Oct 1, 2020
  • Filed:
    Mar 27, 2019
  • Appl. No.:
    16/366197
  • Inventors:
    Anil Kaza - Hillsboro OR, US
    Donald E. Edenfeld - Beaverton OR, US
    Todd P. Albertson - Warren OR, US
    Patrick Whiting - Beaverton OR, US
  • International Classification:
    G01R 1/073
    G01R 1/067
  • Abstract:
    A probe head may be utilized to test an electronic device. The probe head may include a probe axis extending along a length of the probe head. The probe head may include a probe core including a first metal. The probe core may include a core surface having a first dimension. The first dimension may be perpendicular to the probe axis. The probe core may include a probe tip, for instance extending from the core surface along the probe axis. The probe tip has a second dimension that may be perpendicular to the probe axis. The second dimension may be less than the first dimension of the core surface. The probe head may include a cladding layer that includes a second metal. The cladding layer may be coupled around a perimeter of the probe core. The probe tip may extend beyond the cladding layer.
  • Methods And Apparatus For Flex Circuit And Cable Attachment System

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  • US Patent:
    20200260575, Aug 13, 2020
  • Filed:
    Feb 10, 2020
  • Appl. No.:
    16/786043
  • Inventors:
    - Scottsdale AZ, US
    Todd Albertson - Portland OR, US
  • International Classification:
    H05K 1/02
    H01R 12/59
  • Abstract:
    A foldable modular flex circuit for attaching to at least one component. The flex circuit may comprise a central area and at least one tab depending from the central area. The central area may comprise a cable attachment section configured to electrically couple to at least one coaxial cable. A first tab may depend from the central area and is configured to electrically couple to a ball grid array (BGA) of the component. A second pair of tabs may depend from the central area and are configured to electrically couple to an additional at least one component, wherein each tab depends substantially perpendicular from the central area.
  • Probe Pins With Etched Tips For Electrical Die Test

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  • US Patent:
    20200209280, Jul 2, 2020
  • Filed:
    Mar 12, 2020
  • Appl. No.:
    16/817480
  • Inventors:
    - Santa Clara CA, US
    David Craig - Hillsboro OR, US
    Todd P. Albertson - Warren OR, US
    Mohit Mamodia - Chandler AZ, US
    Dingying Xu - Chandler AZ, US
  • Assignee:
    INTEL CORPORATION - Santa Clara CA
  • International Classification:
    G01R 1/073
    G01R 1/067
    G01R 3/00
  • Abstract:
    A prober head to interface an E-testing apparatus to a device under test, which may be an unpackaged die, for example. In some embodiments, the prober head includes an array of conductive pins, each of the pins extending outwardly from a first pin end anchored to a substrate. At least a partial length of each of the pins is coated with a hydrophobic monolayer. The conductive pins may be composite metal wires including a core metal encased by one or more peripheral metal. At a tip of the pins, opposite the first pin end anchored to the substrate, the peripheral metals are recessed from the core metal. In further embodiments, the hydrophobic monolayer is disposed on an outer surface of the peripheral metals, but is substantially absent from a surface of the core metal exposed at the tip.
  • Probe Pins With Etched Tips For Electrical Die Test

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  • US Patent:
    20170276700, Sep 28, 2017
  • Filed:
    Mar 28, 2016
  • Appl. No.:
    15/083082
  • Inventors:
    Joseph D. Stanford - Portland OR, US
    David Craig - Hillsboro OR, US
    Todd P. Albertson - Warren OR, US
    Mohit Mamodia - Chandler AZ, US
    Dingying Xu - Chandler AZ, US
  • International Classification:
    G01R 1/073
    G01R 31/28
    G01R 3/00
  • Abstract:
    A prober head to interface an E-testing apparatus to a device under test, which may be an unpackaged die, for example. In some embodiments, the prober head includes an array of conductive pins, each of the pins extending outwardly from a first pin end anchored to a substrate. At least a partial length of each of the pins is coated with a hydrophobic monolayer. The conductive pins may be composite metal wires including a core metal encased by one or more peripheral metal. At a tip of the pins, opposite the first pin end anchored to the substrate, the peripheral metals are recessed from the core metal. In further embodiments, the hydrophobic monolayer is disposed on an outer surface of the peripheral metals, but is substantially absent from a surface of the core metal exposed at the tip.
Name / Title
Company / Classification
Phones & Addresses
Todd Albertson
President, Secretary, Treasurer
Transportics Corporation
3960 Howard Hughes Pkwy, Las Vegas, NV 89169
2 Un Sq, Las Vegas, NV 89101
Todd Albertson
President, Secretary, Treasurer
Volkinvest Holdings, Inc
PO Box 27740, Las Vegas, NV 89126
2 Un Sq, Seattle, WA 98101
Todd Albertson
President, Secretary, Treasurer
PECAN DEVELOPMENT CORP
PO Box 90130, Los Angeles, CA 90009
26081 Merit Cir, Laguna Beach, CA 92653
PO Box 90170, Los Angeles, CA 90009
Todd Albertson
Small Town Entertainment LLC
Television/Motion Pic N Internet Dvlpmnt
3025 Olympic Blvd, Santa Monica, CA 90404

Youtube

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