Mark D Northrup

US Patent:

20200267880, Aug 20, 2020

Filed:

Feb 19, 2019

Appl. No.:

16/279513

Inventors:

- Newark NY, US
Mark Northrup - Rochester NY, US

International Classification:

H05K 13/08
H01L 21/66
G01R 31/28

Abstract:

A method of assessing a cleanliness of an assembly in a panel during a manufacturing process is provided, wherein an electrical signal of at least one of a predetermined voltage, current or frequency is applied across a first subset and a second subset of nonconnected electrical contacts in a test coupon associated with the assembly, such that the first subset and the second subset have different pitches. In one configuration, the test coupon is tested at higher voltages, currents or frequencies to a point of failure or above a predetermined threshold.

US Patent:

20180356374, Dec 13, 2018

Filed:

Jan 29, 2018

Appl. No.:

15/882473

Inventors:

- Newark NY, US
Mark Northrup - Rochester NY, US

International Classification:

G01N 30/56
G01R 31/28
H01L 23/00

Abstract:

Parts are exposed to liquid chromatography to generate a corresponding chromatogram, wherein the chromatogram is compared to a chromatogram of a genuine part to determine if the tested part is suspect counterfeit. Depending on the selected predetermined target analytes, the generated chromatogram can be used to assess an associated manufacturing process as conforming or non-conforming.

US Patent:

20150078518, Mar 19, 2015

Filed:

Sep 17, 2014

Appl. No.:

14/488553

Inventors:

- Newark NY, US
Mark Northrup - Rochester NY, US
Daniel F. Martinelli - Fairport NY, US

International Classification:

G06T 7/00
G01N 23/223
G01N 23/203
G01N 23/04
G01N 21/84

US Classification:

378 53

Abstract:

A method for counterfeit IC detection includes: providing a computer, an optical and an X-ray imager; optically imaging a package of one or more ICs; pattern matching the package image to identify an IC type; selecting one or more reference images from a reference library; X-ray imaging one or more ICs; performing in any order: comparing an internal lead frame structure of the one or more ICs to images from the reference library to determine a first numerical indicator; and determining a composition of the lead frame of the one or more ICs and to a corresponding composition from the reference library to determine a second numerical indicator; calculating an indication of authenticity based on the first numerical indicator and the second numerical indicator; and accepting or rejecting the one or more ICs based on the indication of authenticity. A system for counterfeit IC detection is also described.

US Patent:

20140258156, Sep 11, 2014

Filed:

Feb 28, 2014

Appl. No.:

14/194127

Inventors:

Achilleas Tziazas - Rochester NY, US
Mark Northrup - Rochester NY, US

International Classification:

G06Q 30/00
G06K 9/00
G06K 9/78
G06K 9/62

US Classification:

705318

Abstract:

A method to create a reference library of known authentic die images includes die images which are known to be a correct representation of the manufacturer's original die mask set. Where actual literal copies of the original die mask set are unavailable, reasonable facsimile images are derived from images of known authentic ICs. The library of images, while mainly including a set of die images, can be further supplemented by package images, images of manufacturer's logos, text listings of known text markings, including, for example, known serial numbers and date codes, and graphical images from any suitable manufacturer publications. A system and method to determine the authenticity of ICs which includes a multi-faceted approach is also described.