Jonathan Mathis Martin

US Patent:

6490913, Dec 10, 2002

Filed:

May 18, 2000

Appl. No.:

09/573277

Inventors:

Jonathan W. Martin - Montgomery Village MD
Edward Embree - Frederick MD
Mark R. VanLandingham - Gaithersburg MD

Assignee:

The United States of America as represented by the Secretary of Commerce - Washington DC

International Classification:

G01B 1130

US Classification:

73105, 738656

Abstract:

The present invention provides a novel humidity chamber suitable for use with an atomic force microscope (AFM). The humidity chamber of the present invention employs an intricate geometrical design which can accommodate a scanned-stylus AFM with an optical lever. This geometrical design allows the invention to enclose one or more of the AFM scanner, tip assembly, optical lever detection system, sample and an optical microscope objective lens, without degrading the ability to operate the AFM or the related systems. The invention is comprised of two major pieces: a chamber within which the AFM scanning head assembly is placed, and an integrated sample platform and spring-loaded base-plate that allows samples to be loaded and unloaded without removal of the chamber from the AFM scanning head assembly. The sample platform, which extends up from the base-plate and is inserted into the chamber, can include a magnet that is securely attached to the base. Once the sample platform is positioned inside the chamber, a locking pin can be inserted between the chamber and the bottom portion of the sample platform to secure the sample platform and base-plate.

US Patent:

6626052, Sep 30, 2003

Filed:

Aug 2, 1999

Appl. No.:

09/180079

Inventors:

Jonathan Martin - Gaithersburg MD
Joannie Chin - Frederick MD

Assignee:

The United States of America as represented by the Secretary of the Commerce - Washington DC

International Classification:

G01N 1700

US Classification:

738656, 356236, 250228

Abstract:

A method and apparatus for irradiating a specimen with a beam of radiation are provided. The method comprises the steps of providing an integrating sphere, a radiation source radiatively communicating with the sphere, and a specimen, the integrating sphere radiatively communicating with the specimen through an aperture in the sphere. The apparatus comprises a radiation source, an integrating sphere in radiative communication with the radiation source, and a specimen holder in radiative communication with the integrating sphere. The disclosed apparatus and method allow the irradiance of a beam of radiation impinging on the specimen to be maintained at a uniform level across the width of the beam to allow quantitative specimen evaluation.