John J Tully

US Patent:

20060155625, Jul 13, 2006

Filed:

Nov 2, 2005

Appl. No.:

11/265640

Inventors:

Steven Bunkin - New York NY, US
Karim Manji - Calgary, CA
John Tully - Hoboken NJ, US
Arthur Miller - New York NY, US
Simon Collier - Brooklyn NY, US

International Classification:

G06Q 40/00

US Classification:

705035000

Abstract:

According to some embodiments, a method includes establishing a special purpose entity in which a first party has made an equity investment. The method further includes establishing a first sales agreement between the special purpose entity and a second party for the special purpose entity to supply a physical commodity to the second party. The method further includes applying a prepayment amount received under the first sales agreement to acquire a guaranteed investment contract from an insurance company. The method further includes establishing a second sales agreement between the special purpose entity and a supplier for the supplier to supply the physical commodity to the special purpose entity.

US Patent:

43933114, Jul 12, 1983

Filed:

May 21, 1982

Appl. No.:

6/380702

Inventors:

Leonard C. Feldman - Berkeley Heights NJ
Joseph S. Kraus - Stirling NJ
Norman H. Tolk - Mendham NJ
Morton M. Traum - Warren NJ
John C. Tully - Berkeley Heights NJ

Assignee:

Bell Telephone Laboratories, Incorporated - Murray Hill NJ

International Classification:

G01N 2322
H01J 3726

US Classification:

2504591

Abstract:

Emission of characteristic electromagnetic radiation in the infrared, visible, or UV from excited particles, typically ions, molecules, or neutral atoms, desorbed from solid surfaces by an incident beam of low-momentum probe radiation has been observed. Disclosed is a method for characterizing solid surfaces based on the observed effect, with low-momentum probe radiation consisting of electrons or photons. Further disclosed is a method for controlling manufacturing processes that is also based on the observed effect. The latter method can, for instance, be advantageously applied in integrated circuit-, integrated optics-, and magnetic bubble device manufacture. Specific examples of applications of the method are registering of masks, control of a direct-writing processing beam, end-point detection in etching, and control of a processing beam for laser- or electron-beam annealing or ion implantation.