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Chung-Ping Chien

from Sammamish, WA

Chung-Ping Chien Phones & Addresses

  • Sammamish, WA

Us Patents

  • Fabrication Of Microelectronics Using Photosensitive Polyimides

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  • US Patent:
    51242389, Jun 23, 1992
  • Filed:
    Dec 20, 1990
  • Appl. No.:
    7/631194
  • Inventors:
    Kishore K. Chakravorty - Mercer Island WA
    Chung-Ping Chien - Redmond WA
  • Assignee:
    The Boeing Company - Seattle WA
  • International Classification:
    G03C 500
  • US Classification:
    430330
  • Abstract:
    A method of photolithographically patterning a layer of a dielectric composition including a photosensitive polyimide provides patterned dielectric features that have vertical wall profiles that are free of distortions normally associated with high temperature production conditions and shrinkage of the dielectric composition. The method is useful in the production of integrated circuits and high density multiconnect structures.
  • Ultraviolet Curing Of Photosensitive Polyimides

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  • US Patent:
    51224402, Jun 16, 1992
  • Filed:
    May 7, 1990
  • Appl. No.:
    7/519321
  • Inventors:
    Chung-Ping Chien - Redmond WA
  • International Classification:
    G03F 740
    G03F 730
  • US Classification:
    430315
  • Abstract:
    Photosensitive polyimides used in microelectronic structures are cross-linked without exposing the associated microelectronic structures to elevated temperatures that can lower the process yield and reduce the reliability of the microelectronic structures. The photosensitive polyimides are cured by exposing them to deep ultraviolet radiation that has a spectral output effective to crosslink the polyimide. The cross-linking hardens the polyimide and renders it insoluble in solvents such as photoresist strippers.
  • Zinc-Based Microfuse

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  • US Patent:
    51025060, Apr 7, 1992
  • Filed:
    Apr 10, 1991
  • Appl. No.:
    7/683349
  • Inventors:
    Minas H. Tanielian - Bellevue WA
    Chung-Ping Chien - Redmond WA
  • Assignee:
    The Boeing Company - Seattle WA
  • International Classification:
    C25D 502
  • US Classification:
    205118
  • Abstract:
    A zinc-based temporary electrical connection (e. g. , a microfuse) useful in electroplating isolated conductor (i. e. , copper) structures and copper/polyimide high-density interconnect structures are disclosed. The microfuse includes a zinc conductor layer, and in some embodiments, additional silicon adhesion and silicon protection layers. The microfuse is conductive, and therefore useful in an electroplating process, until it is treated (e. g. , heated to about 400. degree. C. for one hour), to convert it into an insulator due to zinc oxidation, and remains in this state.
  • Low Loss Channel Waveguide And Method For Making The Same

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  • US Patent:
    51685426, Dec 1, 1992
  • Filed:
    Oct 9, 1991
  • Appl. No.:
    7/773158
  • Inventors:
    Kishore K. Chakravorty - Issaquah WA
    Chung-Ping Chien - Redmond WA
  • Assignee:
    The Boeing Company - Seattle WA
  • International Classification:
    G02B 610
    G03G 1500
  • US Classification:
    385132
  • Abstract:
    Optical waveguides for use in planar structures, such as dielectric layers in multichip modules exhibit low optical loss. The optical waveguides are provided by methods that involve doping of the dielectric layers. The waveguides can be used to interconnect electronic elements and transmit signals at speeds that are compatible with high speed electronic elements.
  • Fabrication Process For Multichip Modules Using Low Temperature Bake And Cure

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  • US Patent:
    59452544, Aug 31, 1999
  • Filed:
    Dec 18, 1996
  • Appl. No.:
    8/768599
  • Inventors:
    Chung-Ping Chien - Redmond WA
    Jean A. Nielsen - Kent WA
    Peter L. Young - Mercer Island WA
  • Assignee:
    The Boeing Company
  • International Classification:
    G03C 558
    G03F 740
  • US Classification:
    430296
  • Abstract:
    A method for manufacturing a multichip module deposited substrate board utilizing alternating layers of high density thin-film metal and either preimidized or non-preimidized organic polymer insulating material wherein the insulating material is cured during manufacture using either ultraviolet radiation, ion beam radiation or electron beam radiation. This method eliminates subjecting the in-process substrate board to temperatures in excess of the recrystalization temperature of the thin-film metal, thereby eliminating the source of warpage and metal interdiffusion and corrosion at the metal to insulating material interface. This process enables successful manufacture of large format multichip module deposited substrate boards in sizes up to approximately 24 inches square.

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